SEM (scanning electron microscope)
Scanning Electron Microscopy
The Scanning electron Microscope (SEM) Laboratory consists of a Cambridge/Leica Stereoscan 440 SEM with image analysis and quantitative EDS capabilities, and an automated sputter coater. The X-ray analysis system was recently upgraded to a silicon drift detector with a 4pi analyzer and software, using funds from Dr. John J.W Rogers and the University.
SEM Calendar (click to access the calendar for sign-ups)
For additional information about the SEM facilities, or for information on obtaining analyses of samples, please contact:
Dr. Drew Coleman
Department of Geological Sciences
325 Mitchell Hall, CB#3315
University of North Carolina
Chapel Hill, NC 27599-3315
email: dcoleman at email dot unc.edu
telephone: (919) 962-0705
fax: (919) 966-4519
Fold in Ordovician rocks, Puna Plateau, Argentina